ATS 2009 - Call for Papers

CALL FOR PAPERS

Scope -- Submissions -- Key Dates -- Additional Information -- Committees

Scope

The Asian Test Symposium (ATS) provides an open forum for researchers and industrial practitioners from all countries of the world, especially from Asia, to exchange innovative ideas on system, board, and device testing with design, manufacturing and field considerations in mind. The official language of the symposium is English.

Original contributions on testing are solicited. Topics of interest include, but are not limited to,
the following categories:

Automatic Test Generation / Fault Simulation
Design for Testability / DfX
Built-In Self-Test / Test Data Compression
Delay Testing
Design Verification
Low-power Testing
Defect-Based Testing / IDDX Testing
Fault Modeling & Diagnosis
Memory Test / FPGA Test

Analog and Mixed-Signal Test
RF Testing / High-Speed I/O Test
System-on-a-Chip Test
System-in-Package Test
Board and System Test
On-line Testing
Network Protocol Testing / NoC Testing
Software Testing
Economics of Test

Submissions

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The ATS'09 Program Committee invites original, unpublished paper submissions on the above topics. Paper submissions should be complete manuscripts, not exceeding six pages (including figures, tables, and bibliography) in a standard IEEE two-column format. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status. On the title page, please include: author name(s) and affiliation(s), and the mailing address, phone number, fax number, and e-mail address of the contact author. A 50-words abstract and five keywords are also required. All submissions are to be made electronically through the ATS’09 website.

Electronic submissions in PDF files are strongly recommended. Detailed instructions for submissions are to be found at the ATS’09 website.

The submission will be considered evidence that upon acceptance the author(s) will prepare the final manuscript (6 pages for regular session) in time for inclusion in the proceedings and will present the paper at the Symposium.

Key Dates

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Submission deadline: May 11, 2009
Notification of acceptance: July 10, 2009
Camera-ready copy: August 10, 2009
Symposium: November 23-26, 2009

Additional Information

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Email: ats09@cs.nchu.edu.tw
URL: http://ats09.nchu.edu.tw

Committees

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General Co-Chair(s)
Shi-Yu Huang
National Tsing-Hua Univ., Taiwan
Ming-Der Shieh, NCKU
National Cheng-Kung Univ., Taiwan

Program Chair
Sying-Jyan Wang
National Chung-Hsing Univ., Taiwan

Tutorial Chair
Jing-Jia Liou
National Tsing-Hua Univ., Taiwan

Publicity Chair
Katherine Shu-Min Li
National Sun Yat-sen Univ., Taiwan

Publication Chair
Tsung-Chu Huang
National Changhua Univ. of Education, Taiwan

Finance Chair
Der-Chen Huang
National Chung-Hsing Univ., Taiwan

Local Arrangement Chair
Ching-Hwa Cheng
Feng Chia Univ., Taiwan

Registration Chair
Yen-Jen Chang
National Chung-Hsing Univ., Taiwan

Industrial Arrangement Chair
Wu-Tung Chen
Mentor Graphics Corporation, USA

Panel Chair
Anis Uzzaman
Cadence Design Systems, New York

North American Liaison
Alex Orailoglu
University of California at San Diego

European Liaison
Zebo Peng
Linkoping University

For more information, visit us on the web at: http://www.event URL.com

The 18th Asian Test Symposium (ATS'09) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC) and the National Chung-Hsing University, Taiwan.

TTTC's Electronic Broadcasting Service
	The 18th Asian Test Symposium (ATS'09) November 23-26, 2009 Evergreen Laurel Hotel Taichung, Taiwan http://ats09.nchu.edu.tw